Influence of Y2O3ZrO2 buffer layers on sputtered films of YBa2Cu3O6+x

D. W. Greve; A. K. Stamper; T. E. Schlesinger; M. Migliuolo

doi:10.1016/0921-5093(89)90609-6

Influence of Y₂O₃ZrO₂ buffer layers on sputtered films of YBa₂Cu₃O_6+x

D. W. Greve
, A. K. Stamper
, T. E. Schlesinger
, M. Migliuolo

Research output: Contribution to journal › Article › peer-review

Abstract

Superconducting thin films of YBa2Cu3O6+x have been sputter deposited on alumina and silicon substrates by using a Y2O3ZrO2 buffer layer. The films exhibit zero resistivity (ρ{variant} < 10-7 Ω cm) at 28 K and 27 K respectively. The results depend strongly on the deposition conditions and also on the temperature of the oxygen post-anneal.

Original language	English
Pages (from-to)	325-328
Number of pages	4
Journal	Materials Science and Engineering A
Volume	109
Issue number	C
DOIs	https://doi.org/10.1016/0921-5093(89)90609-6
State	Published - Mar 1989
Externally published	Yes

ASJC Scopus Subject Areas

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

Access to Document

10.1016/0921-5093(89)90609-6

Cite this

@article{bb0eefa582d94dd2abb13925cad22aeb,

title = "Influence of Y2O3ZrO2 buffer layers on sputtered films of YBa2Cu3O6+x",

abstract = "Superconducting thin films of YBa2Cu3O6+x have been sputter deposited on alumina and silicon substrates by using a Y2O3ZrO2 buffer layer. The films exhibit zero resistivity (ρ\{variant\} < 10-7 Ω cm) at 28 K and 27 K respectively. The results depend strongly on the deposition conditions and also on the temperature of the oxygen post-anneal. ",

author = "Greve, \{D. W.\} and Stamper, \{A. K.\} and Schlesinger, \{T. E.\} and M. Migliuolo",

year = "1989",

month = mar,

doi = "10.1016/0921-5093(89)90609-6",

language = "English",

volume = "109",

pages = "325--328",

journal = "Materials Science and Engineering A",

issn = "0921-5093",

publisher = "Elsevier Ltd",

number = "C",

}

TY - JOUR

T1 - Influence of Y2O3ZrO2 buffer layers on sputtered films of YBa2Cu3O6+x

AU - Greve, D. W.

AU - Stamper, A. K.

AU - Schlesinger, T. E.

AU - Migliuolo, M.

PY - 1989/3

Y1 - 1989/3

N2 - Superconducting thin films of YBa2Cu3O6+x have been sputter deposited on alumina and silicon substrates by using a Y2O3ZrO2 buffer layer. The films exhibit zero resistivity (ρ{variant} < 10-7 Ω cm) at 28 K and 27 K respectively. The results depend strongly on the deposition conditions and also on the temperature of the oxygen post-anneal.

AB - Superconducting thin films of YBa2Cu3O6+x have been sputter deposited on alumina and silicon substrates by using a Y2O3ZrO2 buffer layer. The films exhibit zero resistivity (ρ{variant} < 10-7 Ω cm) at 28 K and 27 K respectively. The results depend strongly on the deposition conditions and also on the temperature of the oxygen post-anneal.

UR - https://www.scopus.com/pages/publications/0024626427

UR - https://www.scopus.com/pages/publications/0024626427#tab=citedBy

U2 - 10.1016/0921-5093(89)90609-6

DO - 10.1016/0921-5093(89)90609-6

M3 - Article

AN - SCOPUS:0024626427

SN - 0921-5093

VL - 109

SP - 325

EP - 328

JO - Materials Science and Engineering A

JF - Materials Science and Engineering A

IS - C

ER -

Influence of Y₂O₃ZrO₂ buffer layers on sputtered films of YBa₂Cu₃O_6+x

Abstract

ASJC Scopus Subject Areas

Access to Document

Other files and links

Fingerprint

Cite this