Microstructure of superconducting YBa2Cu3O 7-δ thin films on Si and alumina substrates with buffer layers

J. W. Lee; M. Migliuolo; A. K. Stamper; D. W. Greve; D. E. Laughlin; T. E. Schlesinger

doi:10.1063/1.343807

Microstructure of superconducting YBa₂Cu₃O _7-δ thin films on Si and alumina substrates with buffer layers

J. W. Lee
, M. Migliuolo
, A. K. Stamper
, D. W. Greve
, D. E. Laughlin
, T. E. Schlesinger

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

The microstructure of YBa2Cu3O7-δ (YBCO) films grown on silicon and alumina substrates with yttria-stabilized zirconia (YSZ) buffer layers has been studied by transmission electron microscopy (TEM) and x-ray diffraction. The as-deposited films are not amorphous, but are in fact composed of small crystalline grains. The top surface of the post-annealed YBCO film consists mainly of the orthorhombic structure of YBCO with large grains. Other phases are present within the films and have been identified. The presence of a very thin interdiffused layer of BaZrO 3 between the YSZ and the YBCO has been shown by cross-sectional TEM.

Original language	English
Pages (from-to)	4886-4890
Number of pages	5
Journal	Journal of Applied Physics
Volume	66
Issue number	10
DOIs	https://doi.org/10.1063/1.343807
State	Published - 1989
Externally published	Yes

ASJC Scopus Subject Areas

General Physics and Astronomy

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title = "Microstructure of superconducting YBa2Cu3O 7-δ thin films on Si and alumina substrates with buffer layers",

abstract = "The microstructure of YBa2Cu3O7-δ (YBCO) films grown on silicon and alumina substrates with yttria-stabilized zirconia (YSZ) buffer layers has been studied by transmission electron microscopy (TEM) and x-ray diffraction. The as-deposited films are not amorphous, but are in fact composed of small crystalline grains. The top surface of the post-annealed YBCO film consists mainly of the orthorhombic structure of YBCO with large grains. Other phases are present within the films and have been identified. The presence of a very thin interdiffused layer of BaZrO 3 between the YSZ and the YBCO has been shown by cross-sectional TEM. ",

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year = "1989",

doi = "10.1063/1.343807",

language = "English",

volume = "66",

pages = "4886--4890",

journal = "Journal of Applied Physics",

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T1 - Microstructure of superconducting YBa2Cu3O 7-δ thin films on Si and alumina substrates with buffer layers

AU - Lee, J. W.

AU - Migliuolo, M.

AU - Stamper, A. K.

AU - Greve, D. W.

AU - Laughlin, D. E.

AU - Schlesinger, T. E.

PY - 1989

Y1 - 1989

N2 - The microstructure of YBa2Cu3O7-δ (YBCO) films grown on silicon and alumina substrates with yttria-stabilized zirconia (YSZ) buffer layers has been studied by transmission electron microscopy (TEM) and x-ray diffraction. The as-deposited films are not amorphous, but are in fact composed of small crystalline grains. The top surface of the post-annealed YBCO film consists mainly of the orthorhombic structure of YBCO with large grains. Other phases are present within the films and have been identified. The presence of a very thin interdiffused layer of BaZrO 3 between the YSZ and the YBCO has been shown by cross-sectional TEM.

AB - The microstructure of YBa2Cu3O7-δ (YBCO) films grown on silicon and alumina substrates with yttria-stabilized zirconia (YSZ) buffer layers has been studied by transmission electron microscopy (TEM) and x-ray diffraction. The as-deposited films are not amorphous, but are in fact composed of small crystalline grains. The top surface of the post-annealed YBCO film consists mainly of the orthorhombic structure of YBCO with large grains. Other phases are present within the films and have been identified. The presence of a very thin interdiffused layer of BaZrO 3 between the YSZ and the YBCO has been shown by cross-sectional TEM.

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JF - Journal of Applied Physics

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ER -

Microstructure of superconducting YBa₂Cu₃O _7-δ thin films on Si and alumina substrates with buffer layers

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